Open Access
Nanoscale Research Letters, volume 11, issue 1, publication number 147
Crossbar Nanoscale HfO2-Based Electronic Synapses
Y. Matveyev
1
,
Roman Kirtaev
1
,
Alena Fetisova
1
,
Sergey Zakharchenko
1
,
Dmitry Negrov
1
,
Publication type: Journal Article
Publication date: 2016-03-15
Journal:
Nanoscale Research Letters
scimago Q1
wos Q1
SJR: 1.016
CiteScore: 15.0
Impact factor: 5.5
ISSN: 19317573, 1556276X
PubMed ID:
26979725
Condensed Matter Physics
General Materials Science
Abstract
Crossbar resistive switching devices down to 40 × 40 nm2 in size comprising 3-nm-thick HfO2 layers are forming-free and exhibit up to 105 switching cycles. Four-nanometer-thick devices display the ability of gradual switching in both directions, thus emulating long-term potentiation/depression properties akin to biological synapses. Both forming-free and gradual switching properties are modeled in terms of oxygen vacancy generation in an ultrathin HfO2 layer. By applying the voltage pulses to the opposite electrodes of nanodevices with the shape emulating spikes in biological neurons, spike-timing-dependent plasticity functionality is demonstrated. Thus, the fabricated memristors in crossbar geometry are promising candidates for hardware implementation of hybrid CMOS-neuron/memristor-synapse neural networks.
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