Taylor & Francis
,  volume 3 ,  pages 16-1-16-32

TXRF Spectrometry in Conditions of Planar X-ray Waveguide-Resonator Application

V.K. Egorov
, 
E. V. Egorov,
Publication type: Book Chapter
Publication date: 2020-04-02
Taylor & Francis
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Egorov V., Egorov, E. V. TXRF Spectrometry in Conditions of Planar X-ray Waveguide-Resonator Application // 21st Century Nanoscience - A Handbook: Advanced Analytic Methods and Instrumentation (Volume Three). 2020. Vol. 3. p. 16-1-16-32.
GOST all authors (up to 50) Copy
Egorov V., Egorov, E. V. TXRF Spectrometry in Conditions of Planar X-ray Waveguide-Resonator Application // 21st Century Nanoscience - A Handbook: Advanced Analytic Methods and Instrumentation (Volume Three). 2020. Vol. 3. p. 16-1-16-32.
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TY - GENERIC
DO - 10.1201/9780429340420-16
UR - https://www.taylorfrancis.com/books/9781000698275/chapters/10.1201/9780429340420-16
TI - TXRF Spectrometry in Conditions of Planar X-ray Waveguide-Resonator Application
T2 - 21st Century Nanoscience - A Handbook: Advanced Analytic Methods and Instrumentation (Volume Three)
AU - Egorov, V.K.
AU - Egorov,, E. V.
PY - 2020
DA - 2020/04/02
PB - Taylor & Francis
SP - 16-1-16-32
VL - 3
ER -
BibTex
Cite this
BibTex (up to 50 authors) Copy
@incollection{2020_Egorov,
author = {V.K. Egorov and E. V. Egorov,},
title = {TXRF Spectrometry in Conditions of Planar X-ray Waveguide-Resonator Application},
publisher = {Taylor & Francis},
year = {2020},
volume = {3},
pages = {16--1--16--32},
month = {apr}
}