2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Institute of Electrical and Electronics Engineers (IEEE)
ISSN:
15505774
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journal names
2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Top-3 citing journals
Lecture Notes in Computer Science
(13 citations)
Most cited in 5 years
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Top-100
Citing journals
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Institute of Electrical and Electronics Engineers (IEEE)
153 citations, 42.15%
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Springer Nature
46 citations, 12.67%
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Elsevier
19 citations, 5.23%
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Association for Computing Machinery (ACM)
8 citations, 2.2%
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Institution of Engineering and Technology (IET)
5 citations, 1.38%
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Wiley
4 citations, 1.1%
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Institute of Electronics, Information and Communications Engineers (IEICE)
4 citations, 1.1%
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IGI Global
3 citations, 0.83%
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Taylor & Francis
2 citations, 0.55%
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MDPI
2 citations, 0.55%
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Hindawi Limited
2 citations, 0.55%
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Emerald
1 citation, 0.28%
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1 citation, 0.28%
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American Association for the Advancement of Science (AAAS)
1 citation, 0.28%
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IOP Publishing
1 citation, 0.28%
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proceedings of the international symposium on multiple-valued logic
1 citation, 0.28%
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Thomas Telford
1 citation, 0.28%
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SAE International
1 citation, 0.28%
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