2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Institute of Electrical and Electronics Engineers (IEEE)
Institute of Electrical and Electronics Engineers (IEEE)
ISSN: 15505774

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SJR
0.212
Варианты названий
2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Публикаций
41
Цитирований
364
Индекс Хирша
11
Публикаций
0
Цитирований
58
Топ-3 цитирующих журналов

Наиболее цитируемые за 5 лет

Топ-100

Цитирующие журналы

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13 цитирований, 3.57%
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
13 цитирований, 3.57%
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9 цитирований, 2.47%
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IEEE Transactions on Computers
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IET Computers and Digital Techniques
4 цитирования, 1.1%
IEEE Transactions on Nuclear Science
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IEEE Transactions on Emerging Topics in Computing
3 цитирования, 0.82%
ACM Journal on Emerging Technologies in Computing Systems
3 цитирования, 0.82%
Lecture Notes in Electrical Engineering
3 цитирования, 0.82%
Analog Integrated Circuits and Signal Processing
3 цитирования, 0.82%
Journal of Supercomputing
3 цитирования, 0.82%
IEEE Access
3 цитирования, 0.82%
Microprocessors and Microsystems
2 цитирования, 0.55%
ACM Computing Surveys
2 цитирования, 0.55%
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
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Lecture Notes of the Institute for Computer Sciences, Social-Informatics and Telecommunications Engineering
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IEICE Electronics Express
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IEEE Transactions on Circuits and Systems II: Express Briefs
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IEEJ Transactions on Electrical and Electronic Engineering
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Sensors
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Science Robotics
1 цитирование, 0.27%
SAE International Journal of Passenger Cars - Electronic and Electrical Systems
1 цитирование, 0.27%
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1 цитирование, 0.27%
Computers and Electrical Engineering
1 цитирование, 0.27%
Semiconductor Science and Technology
1 цитирование, 0.27%
Engineering Applications of Artificial Intelligence
1 цитирование, 0.27%
Journal of Engineering Design
1 цитирование, 0.27%
IEEE Micro
1 цитирование, 0.27%
Elektrotechnik und Informationstechnik
1 цитирование, 0.27%
Proceedings of The International Symposium on Multiple-Valued Logic
1 цитирование, 0.27%
International Journal of Circuit Theory and Applications
1 цитирование, 0.27%
Frontiers of Computer Science
1 цитирование, 0.27%
ACM SIGARCH Computer Architecture News
1 цитирование, 0.27%
Nanomaterials and Energy
1 цитирование, 0.27%
International Journal of Systems Science
1 цитирование, 0.27%
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1 цитирование, 0.27%
The Journal of Engineering
1 цитирование, 0.27%
Advances in Intelligent and Soft Computing
1 цитирование, 0.27%
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1 цитирование, 0.27%
25th IEEE VLSI Test Symmposium (VTS'07)
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IEEE Open Journal of Circuits and Systems
1 цитирование, 0.27%
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Цитирующие издатели

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Institute of Electrical and Electronics Engineers (IEEE)
153 цитирования, 42.03%
Springer Nature
46 цитирований, 12.64%
Elsevier
19 цитирований, 5.22%
Association for Computing Machinery (ACM)
8 цитирований, 2.2%
Institution of Engineering and Technology (IET)
5 цитирований, 1.37%
Wiley
4 цитирования, 1.1%
Institute of Electronics, Information and Communications Engineers (IEICE)
4 цитирования, 1.1%
Hindawi Limited
3 цитирования, 0.82%
IGI Global
3 цитирования, 0.82%
Taylor & Francis
2 цитирования, 0.55%
MDPI
2 цитирования, 0.55%
Emerald
1 цитирование, 0.27%
1 цитирование, 0.27%
American Association for the Advancement of Science (AAAS)
1 цитирование, 0.27%
IOP Publishing
1 цитирование, 0.27%
proceedings of the international symposium on multiple-valued logic
1 цитирование, 0.27%
Thomas Telford
1 цитирование, 0.27%
SAE International
1 цитирование, 0.27%
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