2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Institute of Electrical and Electronics Engineers (IEEE)
Institute of Electrical and Electronics Engineers (IEEE)
ISSN: 15505774

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journal names
2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Publications
41
Citations
363
h-index
11
Publications
0
Citations
57

Most cited in 5 years

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Found 

Top-100

Citing journals

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Citing publishers

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Institute of Electrical and Electronics Engineers (IEEE)
153 citations, 42.15%
Springer Nature
46 citations, 12.67%
Elsevier
19 citations, 5.23%
Association for Computing Machinery (ACM)
8 citations, 2.2%
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5 citations, 1.38%
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4 citations, 1.1%
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4 citations, 1.1%
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3 citations, 0.83%
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1 citation, 0.28%
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1 citation, 0.28%
proceedings of the international symposium on multiple-valued logic
1 citation, 0.28%
Thomas Telford
1 citation, 0.28%
SAE International
1 citation, 0.28%
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