25th IEEE VLSI Test Symmposium (VTS'07)

Institute of Electrical and Electronics Engineers (IEEE)
Institute of Electrical and Electronics Engineers (IEEE)
ISSN: 10930167

Most cited in 5 years

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Top-100

Citing journals

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IEEE Transactions on Very Large Scale Integration (VLSI) Systems
92 citations, 5.66%
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
90 citations, 5.54%
Journal of Electronic Testing: Theory and Applications (JETTA)
58 citations, 3.57%
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26 citations, 1.6%
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7 citations, 0.43%
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25th IEEE VLSI Test Symmposium (VTS'07)
6 citations, 0.37%
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IEICE Transactions on Electronics
1 citation, 0.06%
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1 citation, 0.06%
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1 citation, 0.06%
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1 citation, 0.06%
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1 citation, 0.06%
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1 citation, 0.06%
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1 citation, 0.06%
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1 citation, 0.06%
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1 citation, 0.06%
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1 citation, 0.06%
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1 citation, 0.06%
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1 citation, 0.06%
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1 citation, 0.06%
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1 citation, 0.06%
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1 citation, 0.06%
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1 citation, 0.06%
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1 citation, 0.06%
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IEEE Open Journal of Circuits and Systems
1 citation, 0.06%
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Citing publishers

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Institute of Electrical and Electronics Engineers (IEEE)
845 citations, 51.97%
Springer Nature
118 citations, 7.26%
Association for Computing Machinery (ACM)
78 citations, 4.8%
Elsevier
34 citations, 2.09%
29 citations, 1.78%
Institution of Engineering and Technology (IET)
20 citations, 1.23%
Information Processing Society of Japan
10 citations, 0.62%
IGI Global
8 citations, 0.49%
Wiley
6 citations, 0.37%
Institute of Electronics, Information and Communications Engineers (IEICE)
6 citations, 0.37%
Taylor & Francis
2 citations, 0.12%
Pleiades Publishing
2 citations, 0.12%
MDPI
2 citations, 0.12%
World Scientific
1 citation, 0.06%
Emerald
1 citation, 0.06%
1 citation, 0.06%
Trans Tech Publications
1 citation, 0.06%
AIP Publishing
1 citation, 0.06%
parallel architectures and compilation techniques - conference proceedings, pact
1 citation, 0.06%
Science in China Press
1 citation, 0.06%
Hindawi Limited
1 citation, 0.06%
RTU MIREA
1 citation, 0.06%
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