25th IEEE VLSI Test Symmposium (VTS'07)
Institute of Electrical and Electronics Engineers (IEEE)
ISSN:
10930167
Top-3 citing journals
Most cited in 5 years
Found
Top-100
Citing journals
Citing publishers
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Institute of Electrical and Electronics Engineers (IEEE)
845 citations, 51.97%
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Springer Nature
118 citations, 7.26%
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Association for Computing Machinery (ACM)
78 citations, 4.8%
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Elsevier
34 citations, 2.09%
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29 citations, 1.78%
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Institution of Engineering and Technology (IET)
20 citations, 1.23%
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Information Processing Society of Japan
10 citations, 0.62%
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IGI Global
8 citations, 0.49%
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Wiley
6 citations, 0.37%
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Institute of Electronics, Information and Communications Engineers (IEICE)
6 citations, 0.37%
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Taylor & Francis
2 citations, 0.12%
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Pleiades Publishing
2 citations, 0.12%
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MDPI
2 citations, 0.12%
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World Scientific
1 citation, 0.06%
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Emerald
1 citation, 0.06%
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1 citation, 0.06%
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Trans Tech Publications
1 citation, 0.06%
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AIP Publishing
1 citation, 0.06%
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parallel architectures and compilation techniques - conference proceedings, pact
1 citation, 0.06%
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Science in China Press
1 citation, 0.06%
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Hindawi Limited
1 citation, 0.06%
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RTU MIREA
1 citation, 0.06%
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