25th IEEE VLSI Test Symmposium (VTS'07)
Institute of Electrical and Electronics Engineers (IEEE)
ISSN:
10930167
Are you a researcher?
Create a profile to get free access to personal recommendations for colleagues and new articles.
journal names
25th IEEE VLSI Test Symmposium (VTS'07)
Top-3 citing journals
Most cited in 5 years
Found
Nothing found, try to update filter.
Found
Nothing found, try to update filter.
Top-100
Citing journals
Citing publishers
|
100
200
300
400
500
600
700
800
900
1000
|
|
|
Institute of Electrical and Electronics Engineers (IEEE)
967 citations, 58.39%
|
|
|
Springer Nature
118 citations, 7.13%
|
|
|
Association for Computing Machinery (ACM)
90 citations, 5.43%
|
|
|
Elsevier
34 citations, 2.05%
|
|
|
Institute of Electronics, Information and Communications Engineers (IEICE)
23 citations, 1.39%
|
|
|
Institution of Engineering and Technology (IET)
20 citations, 1.21%
|
|
|
12 citations, 0.72%
|
|
|
Information Processing Society of Japan
10 citations, 0.6%
|
|
|
IGI Global
8 citations, 0.48%
|
|
|
Wiley
6 citations, 0.36%
|
|
|
MDPI
4 citations, 0.24%
|
|
|
Taylor & Francis
3 citations, 0.18%
|
|
|
Pleiades Publishing
2 citations, 0.12%
|
|
|
World Scientific
1 citation, 0.06%
|
|
|
Emerald
1 citation, 0.06%
|
|
|
1 citation, 0.06%
|
|
|
Trans Tech Publications
1 citation, 0.06%
|
|
|
AIP Publishing
1 citation, 0.06%
|
|
|
parallel architectures and compilation techniques - conference proceedings, pact
1 citation, 0.06%
|
|
|
Science in China Press
1 citation, 0.06%
|
|
|
Hindawi Limited
1 citation, 0.06%
|
|
|
RTU MIREA
1 citation, 0.06%
|
|
|
100
200
300
400
500
600
700
800
900
1000
|