2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059)

Institute of Electrical and Electronics Engineers (IEEE)

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Варианты названий

за всё время с 2021

Публикаций

Цитирований

Индекс Хирша

Публикаций

Цитирований

Топ-3 цитирующих журналов

IEEE Transactions on Electron Devices (8 цитирований)

IEEE Transactions on Device and Materials Reliability (4 цитирования)

Microelectronics Reliability (3 цитирования)

Название публикации

	1 2 3 4 5 6 7 8
IEEE Transactions on Electron Devices	IEEE Transactions on Electron Devices, 8, 26.67% IEEE Transactions on Electron Devices 8 цитирований, 26.67%
IEEE Transactions on Device and Materials Reliability	IEEE Transactions on Device and Materials Reliability, 4, 13.33% IEEE Transactions on Device and Materials Reliability 4 цитирования, 13.33%
Microelectronics Reliability	Microelectronics Reliability, 3, 10% Microelectronics Reliability 3 цитирования, 10%
Solid-State Electronics	Solid-State Electronics, 1, 3.33% Solid-State Electronics 1 цитирование, 3.33%
Microelectronic Engineering	Microelectronic Engineering, 1, 3.33% Microelectronic Engineering 1 цитирование, 3.33%
Current Opinion in Solid State and Materials Science	Current Opinion in Solid State and Materials Science, 1, 3.33% Current Opinion in Solid State and Materials Science 1 цитирование, 3.33%
2009 IEEE International Reliability Physics Symposium	2009 IEEE International Reliability Physics Symposium, 1, 3.33% 2009 IEEE International Reliability Physics Symposium 1 цитирование, 3.33%
	1 2 3 4 5 6 7 8

	5 10 15 20 25
Institute of Electrical and Electronics Engineers (IEEE)	Institute of Electrical and Electronics Engineers (IEEE), 22, 73.33% Institute of Electrical and Electronics Engineers (IEEE) 22 цитирования, 73.33%
Elsevier	Elsevier, 6, 20% Elsevier 6 цитирований, 20%
	5 10 15 20 25