2009 IEEE International Reliability Physics Symposium

Institute of Electrical and Electronics Engineers (IEEE)

ISSN: 15417026

Journal publications in Cobalt

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SJR

0.477

CiteScore

3.1

journal names

2009 IEEE International Reliability Physics Symposium

All time from 2020

Publications

Citations

830

h-index

Publications

Citations

171

Top-3 citing journals

IEEE Transactions on Electron Devices (72 citations)

Microelectronics Reliability (33 citations)

IEEE Transactions on Device and Materials Reliability (32 citations)

Most cited in 5 years

Found

Publication title

Found

Top-100

Citing journals

Citing publishers

	100 200 300 400 500 600
Institute of Electrical and Electronics Engineers (IEEE)	Institute of Electrical and Electronics Engineers (IEEE), 573, 69.04% Institute of Electrical and Electronics Engineers (IEEE) 573 citations, 69.04%
Elsevier	Elsevier, 59, 7.11% Elsevier 59 citations, 7.11%
Springer Nature	Springer Nature, 35, 4.22% Springer Nature 35 citations, 4.22%
MDPI	MDPI, 16, 1.93% MDPI 16 citations, 1.93%
Institute of Electronics, Information and Communications Engineers (IEICE)	Institute of Electronics, Information and Communications Engineers (IEICE), 15, 1.81% Institute of Electronics, Information and Communications Engineers (IEICE) 15 citations, 1.81%
Japan Society of Applied Physics	Japan Society of Applied Physics, 9, 1.08% Japan Society of Applied Physics 9 citations, 1.08%
IOP Publishing	IOP Publishing, 9, 1.08% IOP Publishing 9 citations, 1.08%
Wiley	Wiley, 7, 0.84% Wiley 7 citations, 0.84%
Association for Computing Machinery (ACM)	Association for Computing Machinery (ACM), 7, 0.84% Association for Computing Machinery (ACM) 7 citations, 0.84%
AIP Publishing	AIP Publishing, 5, 0.6% AIP Publishing 5 citations, 0.6%
Taylor & Francis	Taylor & Francis, 3, 0.36% Taylor & Francis 3 citations, 0.36%
American Chemical Society (ACS)	American Chemical Society (ACS), 3, 0.36% American Chemical Society (ACS) 3 citations, 0.36%
Institution of Engineering and Technology (IET)	Institution of Engineering and Technology (IET), 3, 0.36% Institution of Engineering and Technology (IET) 3 citations, 0.36%
The Royal Society	The Royal Society, 2, 0.24% The Royal Society 2 citations, 0.24%
Information Processing Society of Japan	Information Processing Society of Japan, 2, 0.24% Information Processing Society of Japan 2 citations, 0.24%
Walter de Gruyter	Walter de Gruyter, 1, 0.12% Walter de Gruyter 1 citation, 0.12%
Oxford University Press	Oxford University Press, 1, 0.12% Oxford University Press 1 citation, 0.12%
IOS Press	IOS Press, 1, 0.12% IOS Press 1 citation, 0.12%
	, 1, 0.12% 1 citation, 0.12%
Pleiades Publishing	Pleiades Publishing, 1, 0.12% Pleiades Publishing 1 citation, 0.12%
Trans Tech Publications	Trans Tech Publications, 1, 0.12% Trans Tech Publications 1 citation, 0.12%
Royal Society of Chemistry (RSC)	Royal Society of Chemistry (RSC), 1, 0.12% Royal Society of Chemistry (RSC) 1 citation, 0.12%
American Physical Society (APS)	American Physical Society (APS), 1, 0.12% American Physical Society (APS) 1 citation, 0.12%
Copernicus	Copernicus, 1, 0.12% Copernicus 1 citation, 0.12%
Mathematical Sciences Publishers	Mathematical Sciences Publishers, 1, 0.12% Mathematical Sciences Publishers 1 citation, 0.12%
American Vacuum Society	American Vacuum Society, 1, 0.12% American Vacuum Society 1 citation, 0.12%
The Electrochemical Society	The Electrochemical Society, 1, 0.12% The Electrochemical Society 1 citation, 0.12%
IGI Global	IGI Global, 1, 0.12% IGI Global 1 citation, 0.12%
IntechOpen	IntechOpen, 1, 0.12% IntechOpen 1 citation, 0.12%
	100 200 300 400 500 600

	10 20 30 40 50 60 70 80
IEEE Transactions on Electron Devices	IEEE Transactions on Electron Devices, 72, 8.67% IEEE Transactions on Electron Devices 72 citations, 8.67%
Microelectronics Reliability	Microelectronics Reliability, 33, 3.98% Microelectronics Reliability 33 citations, 3.98%
IEEE Transactions on Device and Materials Reliability	IEEE Transactions on Device and Materials Reliability, 32, 3.86% IEEE Transactions on Device and Materials Reliability 32 citations, 3.86%
IEEE Transactions on Nuclear Science	IEEE Transactions on Nuclear Science, 21, 2.53% IEEE Transactions on Nuclear Science 21 citations, 2.53%
IEEE Electron Device Letters	IEEE Electron Device Letters, 19, 2.29% IEEE Electron Device Letters 19 citations, 2.29%
Springer Series in Advanced Microelectronics	Springer Series in Advanced Microelectronics, 12, 1.45% Springer Series in Advanced Microelectronics 12 citations, 1.45%
IEEE Transactions on Very Large Scale Integration (VLSI) Systems	IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 12, 1.45% IEEE Transactions on Very Large Scale Integration (VLSI) Systems 12 citations, 1.45%
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems	IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 10, 1.2% IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 10 citations, 1.2%
IEEE Journal of the Electron Devices Society	IEEE Journal of the Electron Devices Society, 8, 0.96% IEEE Journal of the Electron Devices Society 8 citations, 0.96%
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes	Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes, 8, 0.96% Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes 8 citations, 0.96%
IEEE Transactions on Circuits and Systems I: Regular Papers	IEEE Transactions on Circuits and Systems I: Regular Papers, 8, 0.96% IEEE Transactions on Circuits and Systems I: Regular Papers 8 citations, 0.96%
Solid-State Electronics	Solid-State Electronics, 8, 0.96% Solid-State Electronics 8 citations, 0.96%
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences	IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences, 7, 0.84% IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences 7 citations, 0.84%
IEICE Transactions on Electronics	IEICE Transactions on Electronics, 6, 0.72% IEICE Transactions on Electronics 6 citations, 0.72%
Micromachines	Micromachines, 6, 0.72% Micromachines 6 citations, 0.72%
IEEE Transactions on Computers	IEEE Transactions on Computers, 6, 0.72% IEEE Transactions on Computers 6 citations, 0.72%
Journal of Electronic Testing: Theory and Applications (JETTA)	Journal of Electronic Testing: Theory and Applications (JETTA), 6, 0.72% Journal of Electronic Testing: Theory and Applications (JETTA) 6 citations, 0.72%
Electronics (Switzerland)	Electronics (Switzerland), 5, 0.6% Electronics (Switzerland) 5 citations, 0.6%
IEEE Access	IEEE Access, 5, 0.6% IEEE Access 5 citations, 0.6%
Journal of Applied Physics	Journal of Applied Physics, 4, 0.48% Journal of Applied Physics 4 citations, 0.48%
IEEE Journal of Solid-State Circuits	IEEE Journal of Solid-State Circuits, 4, 0.48% IEEE Journal of Solid-State Circuits 4 citations, 0.48%
IEEE Transactions on Semiconductor Manufacturing	IEEE Transactions on Semiconductor Manufacturing, 3, 0.36% IEEE Transactions on Semiconductor Manufacturing 3 citations, 0.36%
IEEE Transactions on Emerging Topics in Computing	IEEE Transactions on Emerging Topics in Computing, 3, 0.36% IEEE Transactions on Emerging Topics in Computing 3 citations, 0.36%
IEEE Transactions on Nanotechnology	IEEE Transactions on Nanotechnology, 3, 0.36% IEEE Transactions on Nanotechnology 3 citations, 0.36%
Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment	Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 3, 0.36% Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 3 citations, 0.36%
SpringerBriefs in Applied Sciences and Technology	SpringerBriefs in Applied Sciences and Technology, 3, 0.36% SpringerBriefs in Applied Sciences and Technology 3 citations, 0.36%
International Journal of Circuit Theory and Applications	International Journal of Circuit Theory and Applications, 3, 0.36% International Journal of Circuit Theory and Applications 3 citations, 0.36%
Microelectronics Journal	Microelectronics Journal, 2, 0.24% Microelectronics Journal 2 citations, 0.24%
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control	IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, 2, 0.24% IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control 2 citations, 0.24%
Chinese Physics B	Chinese Physics B, 2, 0.24% Chinese Physics B 2 citations, 0.24%
IPSJ Transactions on System LSI Design Methodology	IPSJ Transactions on System LSI Design Methodology, 2, 0.24% IPSJ Transactions on System LSI Design Methodology 2 citations, 0.24%
Applied Sciences (Switzerland)	Applied Sciences (Switzerland), 2, 0.24% Applied Sciences (Switzerland) 2 citations, 0.24%
IEEE Journal on Emerging and Selected Topics in Circuits and Systems	IEEE Journal on Emerging and Selected Topics in Circuits and Systems, 2, 0.24% IEEE Journal on Emerging and Selected Topics in Circuits and Systems 2 citations, 0.24%
Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences	Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences, 2, 0.24% Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences 2 citations, 0.24%
Semiconductor Science and Technology	Semiconductor Science and Technology, 2, 0.24% Semiconductor Science and Technology 2 citations, 0.24%
IEICE Electronics Express	IEICE Electronics Express, 2, 0.24% IEICE Electronics Express 2 citations, 0.24%
Journal of Computational Electronics	Journal of Computational Electronics, 2, 0.24% Journal of Computational Electronics 2 citations, 0.24%
IET Circuits, Devices and Systems	IET Circuits, Devices and Systems, 2, 0.24% IET Circuits, Devices and Systems 2 citations, 0.24%
2009 IEEE International Reliability Physics Symposium	2009 IEEE International Reliability Physics Symposium, 2, 0.24% 2009 IEEE International Reliability Physics Symposium 2 citations, 0.24%