Proceedings of the Asian Test Symposium

proceedings of the asian test symposium
ISSN: 10817735
SJR
0.195
CiteScore
1.3
Categories
Electrical and Electronic Engineering
Areas
Engineering
Years of issue
1993-2016, 2018-2022

Most cited in 5 years

Found 
from chars
Publications found: 0

Top-100

Citing journals

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IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
31 citations, 7.89%
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
20 citations, 5.09%
Journal of Electronic Testing: Theory and Applications (JETTA)
12 citations, 3.05%
IEEE Transactions on Computers
9 citations, 2.29%
IEEE Transactions on Instrumentation and Measurement
5 citations, 1.27%
IEICE Transactions on Information and Systems
5 citations, 1.27%
IEEE Access
4 citations, 1.02%
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
3 citations, 0.76%
Applied Sciences (Switzerland)
3 citations, 0.76%
25th IEEE VLSI Test Symmposium (VTS'07)
3 citations, 0.76%
IEICE ESS FUNDAMENTALS REVIEW
3 citations, 0.76%
Microprocessors and Microsystems
2 citations, 0.51%
Microelectronics Reliability
2 citations, 0.51%
Lecture Notes in Computer Science
2 citations, 0.51%
IET Computers and Digital Techniques
2 citations, 0.51%
Journal of Parallel and Distributed Computing
2 citations, 0.51%
Embedded Processor-Based Self-Test
2 citations, 0.51%
12th IEEE European Test Symposium (ETS'07)
2 citations, 0.51%
IEICE Transactions on Electronics
1 citation, 0.25%
Automatic Control and Computer Sciences
1 citation, 0.25%
Microelectronics Journal
1 citation, 0.25%
IEEE Design and Test
1 citation, 0.25%
IEEE Transactions on Circuits and Systems I: Regular Papers
1 citation, 0.25%
Journal of Communications Technology and Electronics
1 citation, 0.25%
IETE Technical Review (Institution of Electronics and Telecommunication Engineers, India)
1 citation, 0.25%
Proceedings of the Asian Test Symposium
1 citation, 0.25%
IEEE Transactions on Industrial Informatics
1 citation, 0.25%
IPSJ Transactions on System LSI Design Methodology
1 citation, 0.25%
Integration, the VLSI Journal
1 citation, 0.25%
Results in Engineering
1 citation, 0.25%
Journal of the Franklin Institute
1 citation, 0.25%
Review of Scientific Instruments
1 citation, 0.25%
IEEE Instrumentation and Measurement Magazine
1 citation, 0.25%
Journal of Engineering, Design and Technology
1 citation, 0.25%
IEEE Transactions on Education
1 citation, 0.25%
Design Automation for Embedded Systems
1 citation, 0.25%
Conference Record - IEEE Instrumentation and Measurement Technology Conference
1 citation, 0.25%
IEEE Transactions on Electromagnetic Compatibility
1 citation, 0.25%
Software Testing Verification and Reliability
1 citation, 0.25%
AIP Conference Proceedings
1 citation, 0.25%
IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers
1 citation, 0.25%
IFIP Advances in Information and Communication Technology
1 citation, 0.25%
Elektrotechnik und Informationstechnik
1 citation, 0.25%
ETRI Journal
1 citation, 0.25%
International Journal of Circuit Theory and Applications
1 citation, 0.25%
Applied Mechanics and Materials
1 citation, 0.25%
IEEE Design & Test of Computers
1 citation, 0.25%
2007 Thirty-Ninth Southeastern Symposium on System Theory
1 citation, 0.25%
2007 IEEE International Workshop on Memory Technology, Design and Testing
1 citation, 0.25%
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Citing publishers

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Institute of Electrical and Electronics Engineers (IEEE)
229 citations, 58.27%
Springer Nature
19 citations, 4.83%
Elsevier
11 citations, 2.8%
8 citations, 2.04%
Institute of Electronics, Information and Communications Engineers (IEICE)
4 citations, 1.02%
Wiley
3 citations, 0.76%
MDPI
3 citations, 0.76%
Pleiades Publishing
2 citations, 0.51%
Institution of Engineering and Technology (IET)
2 citations, 0.51%
AIP Publishing
2 citations, 0.51%
Taylor & Francis
1 citation, 0.25%
Emerald
1 citation, 0.25%
Trans Tech Publications
1 citation, 0.25%
Information Processing Society of Japan
1 citation, 0.25%
proceedings of the asian test symposium
1 citation, 0.25%
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