Education

National Research Nuclear University MEPhI
2016 — 2020, Postgraduate, Institute of Nanotechnology in Electronics, Spintronics and Photonics
National Research Nuclear University MEPhI
2010 — 2016, Specialist, Faculty of Automation and Electronics
Found 
Found 
Found 
Total publications
10
Total citations
51
Citations per publication
5.1
Average publications per year
1.43
Average coauthors
3.3
Publications years
2014-2020 (7 years)
h-index
4
i10-index
3
m-index
0.57
o-index
8
g-index
7
w-index
1
Metrics description
h-index
A scientist has an h-index if h of his N publications are cited at least h times each, while the remaining (N - h) publications are cited no more than h times each.
i10-index
The number of the author's publications that received at least 10 links each.
m-index
The researcher's m-index is numerically equal to the ratio of his h-index to the number of years that have passed since the first publication.
o-index
The geometric mean of the h-index and the number of citations of the most cited article of the scientist.
g-index
For a given set of articles, sorted in descending order of the number of citations that these articles received, the g-index is the largest number such that the g most cited articles received (in total) at least g2 citations.
w-index
If w articles of a researcher have at least 10w citations each and other publications are less than 10(w+1) citations, then the researcher's w-index is equal to w.

Top-100

Fields of science

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3
4
Electrical and Electronic Engineering, 4, 40%
Electrical and Electronic Engineering
4 publications, 40%
Condensed Matter Physics, 3, 30%
Condensed Matter Physics
3 publications, 30%
Electronic, Optical and Magnetic Materials, 2, 20%
Electronic, Optical and Magnetic Materials
2 publications, 20%
Nuclear and High Energy Physics, 2, 20%
Nuclear and High Energy Physics
2 publications, 20%
Nuclear Energy and Engineering, 2, 20%
Nuclear Energy and Engineering
2 publications, 20%
Materials Chemistry, 1, 10%
Materials Chemistry
1 publication, 10%
Surfaces, Coatings and Films, 1, 10%
Surfaces, Coatings and Films
1 publication, 10%
Physical and Theoretical Chemistry, 1, 10%
Physical and Theoretical Chemistry
1 publication, 10%
Spectroscopy, 1, 10%
Spectroscopy
1 publication, 10%
Atomic and Molecular Physics, and Optics, 1, 10%
Atomic and Molecular Physics, and Optics
1 publication, 10%
General Materials Science, 1, 10%
General Materials Science
1 publication, 10%
General Engineering, 1, 10%
General Engineering
1 publication, 10%
Energy Engineering and Power Technology, 1, 10%
Energy Engineering and Power Technology
1 publication, 10%
Safety, Risk, Reliability and Quality, 1, 10%
Safety, Risk, Reliability and Quality
1 publication, 10%
1
2
3
4

Journals

1
2
IEEE Transactions on Nuclear Science
2 publications, 20%
Proceedings of SPIE - The International Society for Optical Engineering
2 publications, 20%
Microelectronics Reliability
1 publication, 10%
High Temperature Material Processes
1 publication, 10%
Journal of Semiconductors
1 publication, 10%
1
2

Citing journals

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2
3
4
5
6
7
8
9
Journal not defined, 9, 17.65%
Journal not defined
9 citations, 17.65%
Microelectronics Reliability
6 citations, 11.76%
Journal of Semiconductors
6 citations, 11.76%
IEEE Transactions on Nuclear Science
6 citations, 11.76%
IOP Conference Series: Materials Science and Engineering
4 citations, 7.84%
Journal of Surface Investigation
3 citations, 5.88%
Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
3 citations, 5.88%
Radiation Physics and Chemistry
2 citations, 3.92%
Proceedings of SPIE - The International Society for Optical Engineering
2 citations, 3.92%
Поверхность Рентгеновские синхротронные и нейтронные исследования
2 citations, 3.92%
Nuclear Science and Techniques/Hewuli
1 citation, 1.96%
Electronics (Switzerland)
1 citation, 1.96%
Integration, the VLSI Journal
1 citation, 1.96%
Acta Physica Sinica
1 citation, 1.96%
Energies
1 citation, 1.96%
Russian Microelectronics
1 citation, 1.96%
IEEE Transactions on Electron Devices
1 citation, 1.96%
Journal of Nanoelectronics and Optoelectronics
1 citation, 1.96%
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2
3
4
5
6
7
8
9

Publishers

1
2
Institute of Electrical and Electronics Engineers (IEEE)
2 publications, 20%
SPIE-Intl Soc Optical Eng
2 publications, 20%
Elsevier
1 publication, 10%
Begell House
1 publication, 10%
IOP Publishing
1 publication, 10%
1
2

Organizations from articles

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2
3
4
5
6
National Research Nuclear University MEPhI
6 publications, 60%
Organization not defined, 4, 40%
Organization not defined
4 publications, 40%
Scientific Research Institute for System Analysis of NRC «Kurchatov Institute»
2 publications, 20%
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2
3
4
5
6

Countries from articles

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2
3
4
5
6
7
8
9
Russia, 9, 90%
Russia
9 publications, 90%
Country not defined, 1, 10%
Country not defined
1 publication, 10%
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2
3
4
5
6
7
8
9

Citing organizations

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4
6
8
10
12
14
Organization not defined, 13, 25.49%
Organization not defined
13 citations, 25.49%
National Research Nuclear University MEPhI
13 citations, 25.49%
Bauman Moscow State Technical University
5 citations, 9.8%
National Research University Higher School of Economics
3 citations, 5.88%
Scientific Research Institute for System Analysis of NRC «Kurchatov Institute»
2 citations, 3.92%
Grenoble Alpes University
2 citations, 3.92%
Xidian University
2 citations, 3.92%
Moscow Institute of Physics and Technology
1 citation, 1.96%
National University of Science & Technology (MISiS)
1 citation, 1.96%
Istanbul Technical University
1 citation, 1.96%
Boğaziçi University
1 citation, 1.96%
Gebze Technical University
1 citation, 1.96%
Tsinghua University
1 citation, 1.96%
Peking University
1 citation, 1.96%
École Polytechnique Fédérale de Lausanne
1 citation, 1.96%
European Organization for Nuclear Research
1 citation, 1.96%
University of Milano-Bicocca
1 citation, 1.96%
Autonomous University of Barcelona
1 citation, 1.96%
Xi'an University of Technology
1 citation, 1.96%
National Institute for Nuclear Physics
1 citation, 1.96%
University of Udine
1 citation, 1.96%
Vanderbilt University
1 citation, 1.96%
University of Buenos Aires
1 citation, 1.96%
Universidad de Sevilla
1 citation, 1.96%
Universidad Carlos III de Madrid
1 citation, 1.96%
Institute of Microelectronics of Barcelona
1 citation, 1.96%
Instituto de Lengua Literatura y Antropología
1 citation, 1.96%
Centro Nacional de Microelectrónica
1 citation, 1.96%
Spanish National Accelerator Center
1 citation, 1.96%
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6
8
10
12
14

Citing countries

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10
15
20
25
Russia, 23, 45.1%
Russia
23 citations, 45.1%
China, 6, 11.76%
China
6 citations, 11.76%
France, 5, 9.8%
France
5 citations, 9.8%
Country not defined, 3, 5.88%
Country not defined
3 citations, 5.88%
Spain, 2, 3.92%
Spain
2 citations, 3.92%
USA, 1, 1.96%
USA
1 citation, 1.96%
Argentina, 1, 1.96%
Argentina
1 citation, 1.96%
India, 1, 1.96%
India
1 citation, 1.96%
Italy, 1, 1.96%
Italy
1 citation, 1.96%
Turkey, 1, 1.96%
Turkey
1 citation, 1.96%
Switzerland, 1, 1.96%
Switzerland
1 citation, 1.96%
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10
15
20
25
  • We do not take into account publications without a DOI.
  • Statistics recalculated daily.
Владимир Валерьевич Репин, Игорь Игоревич Мухин, Максим Геннадьевич Дроздецкий
RU2601172C2, 2016
Владимир Валериевич Репин, Игорь Игоревич Мухин, Герман Владимирович Алексеев, Максим Геннадьевич Дроздецкий
RU2642538C1, 2018
Company/Organization
Position
Leading Microwave Circuit Engineer
Employment type
Full time
Years
2025 — present
Company/Organization
Position
Lead Engineer
Employment type
Full time
Years
2014 — 2025