Applied Physics Letters, volume 94, issue 13, pages 132508

Josephson current in nanofabricated V/Cu/V mesoscopic junctions

Publication typeJournal Article
Publication date2009-03-30
Quartile SCImago
Q1
Quartile WOS
Q2
Impact factor4
ISSN00036951, 10773118
Physics and Astronomy (miscellaneous)
Abstract

We report the fabrication of planar V/Cu/V mesoscopic Josephson weak links of different size and the analysis of their low-temperature behavior. The shorter junctions exhibit critical currents of several tens of microamperes at 350 mK, while Josephson coupling persists up to ∼2.7 K. Good agreement is obtained by comparing the measured switching currents to a model which holds in the diffusive regime. Our results demonstrate that V is an excellent candidate for the implementation of superconducting nanodevices operating at a few kelvins.

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GOST |
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GOST Copy
García C. P., Giazotto F. Josephson current in nanofabricated V/Cu/V mesoscopic junctions // Applied Physics Letters. 2009. Vol. 94. No. 13. p. 132508.
GOST all authors (up to 50) Copy
García C. P., Giazotto F. Josephson current in nanofabricated V/Cu/V mesoscopic junctions // Applied Physics Letters. 2009. Vol. 94. No. 13. p. 132508.
RIS |
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RIS Copy
TY - JOUR
DO - 10.1063/1.3114522
UR - https://doi.org/10.1063/1.3114522
TI - Josephson current in nanofabricated V/Cu/V mesoscopic junctions
T2 - Applied Physics Letters
AU - García, César Pascual
AU - Giazotto, Francesco
PY - 2009
DA - 2009/03/30
PB - AIP Publishing
SP - 132508
IS - 13
VL - 94
SN - 0003-6951
SN - 1077-3118
ER -
BibTex |
Cite this
BibTex Copy
@article{2009_García,
author = {César Pascual García and Francesco Giazotto},
title = {Josephson current in nanofabricated V/Cu/V mesoscopic junctions},
journal = {Applied Physics Letters},
year = {2009},
volume = {94},
publisher = {AIP Publishing},
month = {mar},
url = {https://doi.org/10.1063/1.3114522},
number = {13},
pages = {132508},
doi = {10.1063/1.3114522}
}
MLA
Cite this
MLA Copy
García, César Pascual, and Francesco Giazotto. “Josephson current in nanofabricated V/Cu/V mesoscopic junctions.” Applied Physics Letters, vol. 94, no. 13, Mar. 2009, p. 132508. https://doi.org/10.1063/1.3114522.
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