IEEE International Test Conference (TC)
Institute of Electrical and Electronics Engineers (IEEE)
ISSN:
10893539
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SJR
0.452
CiteScore
2.3
Categories
Applied Mathematics
Electrical and Electronic Engineering
Areas
Engineering
Mathematics
Years of issue
1989, 1992, 1995-2013, 2015-2022
journal names
IEEE International Test Conference (TC)
Top-3 citing journals
SSRN Electronic Journal
(42 citations)
Most cited in 5 years
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Top-100
Citing journals
Citing publishers
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Institute of Electrical and Electronics Engineers (IEEE)
678 citations, 55.21%
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Springer Nature
91 citations, 7.41%
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Social Science Electronic Publishing
42 citations, 3.42%
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Elsevier
31 citations, 2.52%
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Institute of Electronics, Information and Communications Engineers (IEICE)
22 citations, 1.79%
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Association for Computing Machinery (ACM)
12 citations, 0.98%
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Institution of Engineering and Technology (IET)
6 citations, 0.49%
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Information Processing Society of Japan
6 citations, 0.49%
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Trans Tech Publications
5 citations, 0.41%
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IGI Global
4 citations, 0.33%
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Taylor & Francis
3 citations, 0.24%
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MDPI
3 citations, 0.24%
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Cambridge University Press
1 citation, 0.08%
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Wiley
1 citation, 0.08%
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World Scientific
1 citation, 0.08%
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1 citation, 0.08%
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IBM Corp.
1 citation, 0.08%
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canadian conference on electrical and computer engineering
1 citation, 0.08%
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Science in China Press
1 citation, 0.08%
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