Journal of Integrated Circuits and Systems

Springer Nature
Springer Nature
ISSN: 18071953, 18720234
SCImago
Q4
SJR
0.156
CiteScore
0.9
Categories
Electrical and Electronic Engineering
Areas
Engineering
Years of issue
2007-2023
Publications
155
Citations
757
h-index
12
Publications
140
Citations
412
Top-3 citing journals

Most cited in 5 years

Found 
from chars
Publications found: 0

Top-100

Citing journals

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Solid-State Electronics
28 citations, 3.7%
IEEE Transactions on Electron Devices
18 citations, 2.38%
Microelectronics Reliability
11 citations, 1.45%
Analog Integrated Circuits and Signal Processing
11 citations, 1.45%
Circuits, Systems, and Signal Processing
10 citations, 1.32%
IEEE Transactions on Nanotechnology
9 citations, 1.19%
IEEE Transactions on Circuits and Systems I: Regular Papers
9 citations, 1.19%
IEEE Sensors Journal
9 citations, 1.19%
Applied Physics A: Materials Science and Processing
9 citations, 1.19%
Sensors
9 citations, 1.19%
Microelectronics Journal
8 citations, 1.06%
IEEE Access
8 citations, 1.06%
Micromachines
7 citations, 0.92%
Semiconductor Science and Technology
7 citations, 0.92%
Journal of Computational Electronics
7 citations, 0.92%
Lecture Notes in Computer Science
6 citations, 0.79%
Journal of Real-Time Image Processing
5 citations, 0.66%
Journal Physics D: Applied Physics
5 citations, 0.66%
IEEE Transactions on Nuclear Science
5 citations, 0.66%
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
5 citations, 0.66%
International Journal of Circuit Theory and Applications
5 citations, 0.66%
Microprocessors and Microsystems
4 citations, 0.53%
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
4 citations, 0.53%
Materials Research Express
4 citations, 0.53%
Journal of Applied Physics
4 citations, 0.53%
Microelectronic Engineering
4 citations, 0.53%
Journal of Materials Science: Materials in Electronics
4 citations, 0.53%
Materials Today: Proceedings
4 citations, 0.53%
IEEE Journal of the Electron Devices Society
3 citations, 0.4%
Journal of Circuits, Systems and Computers
3 citations, 0.4%
International Journal of Numerical Modelling: Electronic Networks, Devices and Fields
3 citations, 0.4%
Applied Physics Letters
3 citations, 0.4%
IEEE Electron Device Letters
3 citations, 0.4%
Materials Science in Semiconductor Processing
3 citations, 0.4%
ECS Journal of Solid State Science and Technology
3 citations, 0.4%
Nanomaterials
3 citations, 0.4%
IEEE Transactions on Device and Materials Reliability
3 citations, 0.4%
Applied Surface Science
3 citations, 0.4%
Optik
3 citations, 0.4%
Applied Sciences (Switzerland)
3 citations, 0.4%
Optical and Quantum Electronics
3 citations, 0.4%
Thin Solid Films
3 citations, 0.4%
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
3 citations, 0.4%
Multimedia Tools and Applications
3 citations, 0.4%
ACM Transactions on Design Automation of Electronic Systems
3 citations, 0.4%
Sensors and Actuators, A: Physical
3 citations, 0.4%
Solar Energy
3 citations, 0.4%
IETE Journal of Research
3 citations, 0.4%
IEEE Transactions on Circuits and Systems for Video Technology
3 citations, 0.4%
AEU - International Journal of Electronics and Communications
3 citations, 0.4%
Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics
3 citations, 0.4%
Applied Physics Reviews
2 citations, 0.26%
RSC Advances
2 citations, 0.26%
Journal of Physics: Conference Series
2 citations, 0.26%
Electronics (Switzerland)
2 citations, 0.26%
IEEE Transactions on Computers
2 citations, 0.26%
Silicon
2 citations, 0.26%
Physica Status Solidi (A) Applications and Materials Science
2 citations, 0.26%
Optics and Laser Technology
2 citations, 0.26%
ACM Transactions on Reconfigurable Technology and Systems
2 citations, 0.26%
Journal of Electronic Testing: Theory and Applications (JETTA)
2 citations, 0.26%
Vacuum
2 citations, 0.26%
Lecture Notes in Electrical Engineering
2 citations, 0.26%
IEEE Journal of Solid-State Circuits
2 citations, 0.26%
Journal of Control, Automation and Electrical Systems
2 citations, 0.26%
International Journal of Heat and Mass Transfer
2 citations, 0.26%
Nanotechnology
2 citations, 0.26%
Journal of Heat Transfer
2 citations, 0.26%
Journal of Non-Crystalline Solids
2 citations, 0.26%
Computers and Electrical Engineering
2 citations, 0.26%
Transactions on Emerging Telecommunications Technologies
2 citations, 0.26%
AIP Conference Proceedings
2 citations, 0.26%
Journal of Petroleum Exploration and Production Technology
2 citations, 0.26%
IEEE Transactions on Circuits and Systems II: Express Briefs
2 citations, 0.26%
Russian Microelectronics
2 citations, 0.26%
Journal of Low Power Electronics and Applications
2 citations, 0.26%
IET Circuits, Devices and Systems
2 citations, 0.26%
Coatings
2 citations, 0.26%
Advanced Materials
2 citations, 0.26%
SID Symposium Digest of Technical Papers
2 citations, 0.26%
IEEE Open Journal of Circuits and Systems
2 citations, 0.26%
IEEE Transactions on Semiconductor Manufacturing
1 citation, 0.13%
Materials Science Forum
1 citation, 0.13%
Journal of Surface Investigation
1 citation, 0.13%
Nanoscale
1 citation, 0.13%
Journal of Environmental Chemical Engineering
1 citation, 0.13%
Nature Nanotechnology
1 citation, 0.13%
New Journal of Physics
1 citation, 0.13%
Micron
1 citation, 0.13%
Green Chemistry
1 citation, 0.13%
International Journal of Electronics
1 citation, 0.13%
IEEE Transactions on Emerging Topics in Computing
1 citation, 0.13%
ACS applied materials & interfaces
1 citation, 0.13%
Laser Physics
1 citation, 0.13%
Microelectronics International
1 citation, 0.13%
Advanced Optical Materials
1 citation, 0.13%
Chemosensors
1 citation, 0.13%
ACM Computing Surveys
1 citation, 0.13%
International Journal of Machine Learning and Cybernetics
1 citation, 0.13%
npj 2D Materials and Applications
1 citation, 0.13%
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Citing publishers

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Institute of Electrical and Electronics Engineers (IEEE)
215 citations, 28.4%
Elsevier
115 citations, 15.19%
Springer Nature
91 citations, 12.02%
MDPI
33 citations, 4.36%
IOP Publishing
26 citations, 3.43%
Wiley
22 citations, 2.91%
AIP Publishing
13 citations, 1.72%
Taylor & Francis
8 citations, 1.06%
Royal Society of Chemistry (RSC)
7 citations, 0.92%
Association for Computing Machinery (ACM)
7 citations, 0.92%
Pleiades Publishing
5 citations, 0.66%
IGI Global
5 citations, 0.66%
American Chemical Society (ACS)
4 citations, 0.53%
Japan Society of Applied Physics
4 citations, 0.53%
American Vacuum Society
4 citations, 0.53%
The Electrochemical Society
4 citations, 0.53%
World Scientific
3 citations, 0.4%
Trans Tech Publications
3 citations, 0.4%
Institution of Engineering and Technology (IET)
3 citations, 0.4%
Hindawi Limited
3 citations, 0.4%
ASME International
3 citations, 0.4%
Emerald
2 citations, 0.26%
Optica Publishing Group
2 citations, 0.26%
Walter de Gruyter
1 citation, 0.13%
Frontiers Media S.A.
1 citation, 0.13%
1 citation, 0.13%
Japan Institute of Metals
1 citation, 0.13%
American Physical Society (APS)
1 citation, 0.13%
Korean Institute of Metals and Materials
1 citation, 0.13%
Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences
1 citation, 0.13%
Optical Society of India
1 citation, 0.13%
The Russian Academy of Sciences
1 citation, 0.13%
Opto-Electronic Advances
1 citation, 0.13%
Social Science Electronic Publishing
1 citation, 0.13%
SPIE-Intl Soc Optical Eng
1 citation, 0.13%
University of Toronto Press Inc. (UTPress)
1 citation, 0.13%
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