Journal of Micro/Nanopatterning Materials and Metrology

SPIE-Intl Soc Optical Eng
SPIE-Intl Soc Optical Eng
ISSN: 27088340

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Years of issue
2024-2025
journal names
Journal of Micro/Nanopatterning Materials and Metrology
Publications
293
Citations
699
h-index
12
Top-3 countries
USA (95 publications)
Belgium (46 publications)
China (35 publications)

Most cited in 5 years

from 3 chars
Publications found: 0

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Citing journals

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Publishing organizations in 5 years

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Publishing countries

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USA, 95, 32.42%
Belgium, 46, 15.7%
China, 35, 11.95%
Japan, 35, 11.95%
Germany, 33, 11.26%
Netherlands, 23, 7.85%
Republic of Korea, 12, 4.1%
Switzerland, 8, 2.73%
France, 6, 2.05%
Israel, 5, 1.71%
United Kingdom, 3, 1.02%
Russia, 2, 0.68%
Vietnam, 2, 0.68%
India, 2, 0.68%
Austria, 1, 0.34%
Hungary, 1, 0.34%
Greece, 1, 0.34%
Egypt, 1, 0.34%
Iran, 1, 0.34%
Canada, 1, 0.34%
Latvia, 1, 0.34%
Mexico, 1, 0.34%
UAE, 1, 0.34%
Turkey, 1, 0.34%
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Publishing countries in 5 years

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USA, 95, 32.53%
Belgium, 46, 15.75%
Japan, 35, 11.99%
China, 34, 11.64%
Germany, 33, 11.3%
Netherlands, 23, 7.88%
Republic of Korea, 12, 4.11%
Switzerland, 8, 2.74%
France, 6, 2.05%
Israel, 5, 1.71%
United Kingdom, 3, 1.03%
Russia, 2, 0.68%
Vietnam, 2, 0.68%
India, 2, 0.68%
Austria, 1, 0.34%
Hungary, 1, 0.34%
Greece, 1, 0.34%
Egypt, 1, 0.34%
Iran, 1, 0.34%
Canada, 1, 0.34%
Latvia, 1, 0.34%
Mexico, 1, 0.34%
UAE, 1, 0.34%
Turkey, 1, 0.34%
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