Twenty-Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium
Institute of Electrical and Electronics Engineers (IEEE)
ISSN:
10652221
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SJR
0.120
CiteScore
0.6
Categories
Electrical and Electronic Engineering
Instrumentation
Areas
Engineering
Physics and Astronomy
Years of issue
1995-2017
journal names
Twenty-Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium
Top-3 citing journals
Applied Thermal Engineering
(16 citations)
International Journal of Heat and Mass Transfer
(14 citations)
Energies
(12 citations)
Most cited in 5 years
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Top-100
Citing journals
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Institute of Electrical and Electronics Engineers (IEEE)
183 citations, 42.86%
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Elsevier
66 citations, 15.46%
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Springer Nature
28 citations, 6.56%
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MDPI
24 citations, 5.62%
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ASME International
13 citations, 3.04%
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AIP Publishing
7 citations, 1.64%
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Emerald
6 citations, 1.41%
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Springer New York
6 citations, 1.41%
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Taylor & Francis
5 citations, 1.17%
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Wiley
4 citations, 0.94%
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Institution of Engineering and Technology (IET)
4 citations, 0.94%
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IOP Publishing
3 citations, 0.7%
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American Chemical Society (ACS)
2 citations, 0.47%
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EDP Sciences
2 citations, 0.47%
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Begell House
2 citations, 0.47%
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Pleiades Publishing
2 citations, 0.47%
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Trans Tech Publications
2 citations, 0.47%
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Japan Institute of Electronics Packaging
2 citations, 0.47%
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SAE International
2 citations, 0.47%
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American Association for the Advancement of Science (AAAS)
1 citation, 0.23%
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Universitat Politecnica de Valencia
1 citation, 0.23%
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Acoustical Society of America (ASA)
1 citation, 0.23%
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Association for Computing Machinery (ACM)
1 citation, 0.23%
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Science in China Press
1 citation, 0.23%
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Scientific Research Publishing
1 citation, 0.23%
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IntechOpen
1 citation, 0.23%
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Institute of Electronics, Information and Communications Engineers (IEICE)
1 citation, 0.23%
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Industrial University of Tyumen
1 citation, 0.23%
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