Twenty-Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium

Institute of Electrical and Electronics Engineers (IEEE)
Institute of Electrical and Electronics Engineers (IEEE)
ISSN: 10652221

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SJR
0.120
CiteScore
0.6
Categories
Electrical and Electronic Engineering
Instrumentation
Areas
Engineering
Physics and Astronomy
Years of issue
1995-2017
journal names
Twenty-Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium
Publications
59
Citations
427
h-index
11
Publications
0
Citations
159
Top-3 citing journals

Most cited in 5 years

Found 
Found 

Top-100

Citing journals

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Applied Thermal Engineering
16 citations, 3.75%
International Journal of Heat and Mass Transfer
14 citations, 3.28%
Energies
12 citations, 2.81%
IEEE Transactions on Components, Packaging and Manufacturing Technology
9 citations, 2.11%
IEEE Transactions on Power Electronics
9 citations, 2.11%
Experimental Thermal and Fluid Science
7 citations, 1.64%
IEEE Transactions on Electron Devices
7 citations, 1.64%
IEEE Journal of Emerging and Selected Topics in Power Electronics
6 citations, 1.41%
2008 11th Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems
6 citations, 1.41%
Solid State Lighting Technology and Application Series
6 citations, 1.41%
Journal of Electronic Packaging, Transactions of the ASME
5 citations, 1.17%
IEEE Transactions on Instrumentation and Measurement
5 citations, 1.17%
Journal of Applied Physics
5 citations, 1.17%
Journal of Heat Transfer
5 citations, 1.17%
IEEE Access
4 citations, 0.94%
IEEE Open Journal of Industry Applications
4 citations, 0.94%
IEEE Transactions on Industrial Electronics
3 citations, 0.7%
Microsystem Technologies
3 citations, 0.7%
Applied Sciences (Switzerland)
3 citations, 0.7%
Arabian Journal for Science and Engineering
3 citations, 0.7%
Twenty-Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium
3 citations, 0.7%
Soldering and Surface Mount Technology
2 citations, 0.47%
IEEE Transactions on Semiconductor Manufacturing
2 citations, 0.47%
Microelectronics Reliability
2 citations, 0.47%
Microelectronics International
2 citations, 0.47%
International Journal of Heat and Fluid Flow
2 citations, 0.47%
Micro and Nano Letters
2 citations, 0.47%
IEEE Transactions on Dielectrics and Electrical Insulation
2 citations, 0.47%
Materials Science in Semiconductor Processing
2 citations, 0.47%
International Journal of Thermal Sciences
2 citations, 0.47%
Journal of Thermal Science and Engineering Applications
2 citations, 0.47%
Heat and Mass Transfer
2 citations, 0.47%
Energy Conversion and Management
2 citations, 0.47%
IEEE Transactions on Device and Materials Reliability
2 citations, 0.47%
Review of Scientific Instruments
2 citations, 0.47%
IEEE Transactions on Transportation Electrification
2 citations, 0.47%
Procedia Engineering
2 citations, 0.47%
International Journal of Energy Research
2 citations, 0.47%
Journal of Electronic Materials
2 citations, 0.47%
Applied Mathematical Modelling
2 citations, 0.47%
Energy
2 citations, 0.47%
SAE Technical Papers
2 citations, 0.47%
IEEE Transactions on Industry Applications
2 citations, 0.47%
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
2 citations, 0.47%
Journal of Thermal Analysis and Calorimetry
2 citations, 0.47%
Frontiers of Energy and Power Engineering in China
2 citations, 0.47%
Transactions of The Japan Institute of Electronics Packaging
2 citations, 0.47%
Carbon
1 citation, 0.23%
Fluids
1 citation, 0.23%
Micromachines
1 citation, 0.23%
IET Optoelectronics
1 citation, 0.23%
IEEE Transactions on Nanotechnology
1 citation, 0.23%
IEEE Industrial Electronics Magazine
1 citation, 0.23%
IEEE Journal of the Electron Devices Society
1 citation, 0.23%
History of Mechanism and Machine Science
1 citation, 0.23%
High Voltage
1 citation, 0.23%
Case Studies in Thermal Engineering
1 citation, 0.23%
Journal of the Acoustical Society of America
1 citation, 0.23%
Energy Sources, Part A: Recovery, Utilization and Environmental Effects
1 citation, 0.23%
Microelectronics Journal
1 citation, 0.23%
Scientia Sinica: Physica, Mechanica et Astronomica
1 citation, 0.23%
IEEE Photonics Technology Letters
1 citation, 0.23%
International Communications in Heat and Mass Transfer
1 citation, 0.23%
Archives of Computational Methods in Engineering
1 citation, 0.23%
Building and Environment
1 citation, 0.23%
Thermal Science and Engineering Progress
1 citation, 0.23%
Energy Procedia
1 citation, 0.23%
IEEE Transactions on Plasma Science
1 citation, 0.23%
IEEE Transactions on Industrial Informatics
1 citation, 0.23%
IEEE Communications Surveys and Tutorials
1 citation, 0.23%
International Journal of Energy for a Clean Environment
1 citation, 0.23%
Journal of Thermal Science
1 citation, 0.23%
Journal of the Korean Physical Society
1 citation, 0.23%
Reports on Progress in Physics
1 citation, 0.23%
Nanomaterials
1 citation, 0.23%
Nano Letters
1 citation, 0.23%
Quantitative InfraRed Thermography Journal
1 citation, 0.23%
E3S Web of Conferences
1 citation, 0.23%
Nanoscale and Microscale Thermophysical Engineering
1 citation, 0.23%
Nano Research
1 citation, 0.23%
International Journal of Thermophysics
1 citation, 0.23%
NDT and E International
1 citation, 0.23%
EPJ Web of Conferences
1 citation, 0.23%
Applied Energy
1 citation, 0.23%
Industrial Lubrication and Tribology
1 citation, 0.23%
Journal Physics D: Applied Physics
1 citation, 0.23%
Springer Series in Advanced Microelectronics
1 citation, 0.23%
Circuit World
1 citation, 0.23%
Measurement Science and Technology
1 citation, 0.23%
Materials Research Innovations
1 citation, 0.23%
Sustainability
1 citation, 0.23%
Microsystems and Nanoengineering
1 citation, 0.23%
Journal of Electrostatics
1 citation, 0.23%
Sensors
1 citation, 0.23%
Journal of Power Electronics
1 citation, 0.23%
European Physical Journal Plus
1 citation, 0.23%
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
1 citation, 0.23%
Mapan - Journal of Metrology Society of India
1 citation, 0.23%
Batteries
1 citation, 0.23%
RIAI - Revista Iberoamericana de Automatica e Informatica Industrial
1 citation, 0.23%
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Citing publishers

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Institute of Electrical and Electronics Engineers (IEEE)
183 citations, 42.86%
Elsevier
66 citations, 15.46%
Springer Nature
28 citations, 6.56%
MDPI
24 citations, 5.62%
ASME International
13 citations, 3.04%
AIP Publishing
7 citations, 1.64%
Emerald
6 citations, 1.41%
Springer New York
6 citations, 1.41%
Taylor & Francis
5 citations, 1.17%
Wiley
4 citations, 0.94%
Institution of Engineering and Technology (IET)
4 citations, 0.94%
IOP Publishing
3 citations, 0.7%
American Chemical Society (ACS)
2 citations, 0.47%
EDP Sciences
2 citations, 0.47%
Begell House
2 citations, 0.47%
Pleiades Publishing
2 citations, 0.47%
Trans Tech Publications
2 citations, 0.47%
Japan Institute of Electronics Packaging
2 citations, 0.47%
SAE International
2 citations, 0.47%
American Association for the Advancement of Science (AAAS)
1 citation, 0.23%
Universitat Politecnica de Valencia
1 citation, 0.23%
Acoustical Society of America (ASA)
1 citation, 0.23%
Association for Computing Machinery (ACM)
1 citation, 0.23%
Science in China Press
1 citation, 0.23%
Scientific Research Publishing
1 citation, 0.23%
IntechOpen
1 citation, 0.23%
Institute of Electronics, Information and Communications Engineers (IEICE)
1 citation, 0.23%
Industrial University of Tyumen
1 citation, 0.23%
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