Laboratory of Reflectometry and Small Angle Scattering
Publications
165
Citations
875
h-index
14
Authorization required.
The laboratory specializes in the study of partially ordered systems by X-ray methods with a resolution from 1 A to 10 microns. Developed methods: X-ray microtomography and microscopy, small angle X-ray scattering, X-ray reflectometry and diffractometry
Research directions
Investigation of biological objects by X-ray phase contrast methods
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Publications and patents
Lab address
Москва, Ленинский проспект, 59
Authorization required.