See full statistics
Total publications
56
Total citations
682
Citations per publication
12.18
Average publications per year
2.15
Average coauthors
6.3
Publications years
1999-2024 (26 years)
h-index
14
i10-index
18
m-index
0.54
o-index
43
g-index
24
w-index
4
Metrics description
h-index
A scientist has an h-index if h of his N publications are cited at least h times each, while the remaining (N - h) publications are cited no more than h times each.
i10-index
The number of the author's publications that received at least 10 links each.
m-index
The researcher's m-index is numerically equal to the ratio of his h-index to the number of years that have passed since the first publication.
o-index
The geometric mean of the h-index and the number of citations of the most cited article of the scientist.
g-index
For a given set of articles, sorted in descending order of the number of citations that these articles received, the g-index is the largest number such that the g most cited articles received (in total) at least g2 citations.
w-index
If w articles of a researcher have at least 10w citations each and other publications are less than 10(w+1) citations, then the researcher's w-index is equal to w.

Fields of science

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2
3
4
5
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7
8
9
Electrical and Electronic Engineering, 9, 16.07%
Electrical and Electronic Engineering
9 publications, 16.07%
Atomic and Molecular Physics, and Optics, 8, 14.29%
Atomic and Molecular Physics, and Optics
8 publications, 14.29%
Instrumentation, 8, 14.29%
Instrumentation
8 publications, 14.29%
Electronic, Optical and Magnetic Materials, 7, 12.5%
Electronic, Optical and Magnetic Materials
7 publications, 12.5%
Physical and Theoretical Chemistry, 7, 12.5%
Physical and Theoretical Chemistry
7 publications, 12.5%
Condensed Matter Physics, 5, 8.93%
Condensed Matter Physics
5 publications, 8.93%
Nuclear and High Energy Physics, 5, 8.93%
Nuclear and High Energy Physics
5 publications, 8.93%
Materials Chemistry, 4, 7.14%
Materials Chemistry
4 publications, 7.14%
Surfaces, Coatings and Films, 4, 7.14%
Surfaces, Coatings and Films
4 publications, 7.14%
General Physics and Astronomy, 4, 7.14%
General Physics and Astronomy
4 publications, 7.14%
Inorganic Chemistry, 3, 5.36%
Inorganic Chemistry
3 publications, 5.36%
General Materials Science, 3, 5.36%
General Materials Science
3 publications, 5.36%
General Chemistry, 2, 3.57%
General Chemistry
2 publications, 3.57%
Radiation, 2, 3.57%
Radiation
2 publications, 3.57%
Biochemistry, 1, 1.79%
Biochemistry
1 publication, 1.79%
General Biochemistry, Genetics and Molecular Biology, 1, 1.79%
General Biochemistry, Genetics and Molecular Biology
1 publication, 1.79%
Computer Science Applications, 1, 1.79%
Computer Science Applications
1 publication, 1.79%
Analytical Chemistry, 1, 1.79%
Analytical Chemistry
1 publication, 1.79%
Physics and Astronomy (miscellaneous), 1, 1.79%
Physics and Astronomy (miscellaneous)
1 publication, 1.79%
Surfaces and Interfaces, 1, 1.79%
Surfaces and Interfaces
1 publication, 1.79%
Hardware and Architecture, 1, 1.79%
Hardware and Architecture
1 publication, 1.79%
General Engineering, 1, 1.79%
General Engineering
1 publication, 1.79%
Geochemistry and Petrology, 1, 1.79%
Geochemistry and Petrology
1 publication, 1.79%
General Computer Science, 1, 1.79%
General Computer Science
1 publication, 1.79%
1
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3
4
5
6
7
8
9

Journals

2
4
6
8
10
12
14
16
Proceedings of SPIE - The International Society for Optical Engineering
16 publications, 28.57%
Optics Communications
4 publications, 7.14%
Inorganic Chemistry Communication
4 publications, 7.14%
Journal of Surface Investigation
3 publications, 5.36%
Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
3 publications, 5.36%
AIP Conference Proceedings
3 publications, 5.36%
Review of Scientific Instruments
2 publications, 3.57%
Journal of Synchrotron Radiation
2 publications, 3.57%
Twelfth International Conference on Machine Vision (ICMV 2019)
2 publications, 3.57%
Solid State Phenomena
1 publication, 1.79%
Computer Optics
1 publication, 1.79%
Journal of Physics: Conference Series
1 publication, 1.79%
Applied Physics Letters
1 publication, 1.79%
Physical Review Letters
1 publication, 1.79%
Physica Status Solidi (A) Applications and Materials Science
1 publication, 1.79%
Journal of Applied Crystallography
1 publication, 1.79%
Microsystem Technologies
1 publication, 1.79%
Journal of Rare Earths
1 publication, 1.79%
Semiconductors
1 publication, 1.79%
Sensors
1 publication, 1.79%
Bulletin of the Russian Academy of Sciences: Physics
1 publication, 1.79%
Crystallography Reports
1 publication, 1.79%
IEEE Access
1 publication, 1.79%
Journal de Physique IV (Proceedings)
1 publication, 1.79%
e-Prime - Advances in Electrical Engineering Electronics and Energy
1 publication, 1.79%
Thirteenth International Conference on Machine Vision
1 publication, 1.79%
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6
8
10
12
14
16

Citing journals

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100
120
140
Journal not defined, 138, 20.23%
Journal not defined
138 citations, 20.23%
Journal of Synchrotron Radiation
102 citations, 14.96%
Optics Express
39 citations, 5.72%
Journal of Surface Investigation
28 citations, 4.11%
Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
18 citations, 2.64%
AIP Conference Proceedings
16 citations, 2.35%
Crystallography Reports
14 citations, 2.05%
Journal of Physics: Conference Series
13 citations, 1.91%
Applied Physics Letters
12 citations, 1.76%
Synchrotron Radiation News
12 citations, 1.76%
Journal of Micromechanics and Microengineering
12 citations, 1.76%
Uspekhi Fizicheskih Nauk
12 citations, 1.76%
Review of Scientific Instruments
10 citations, 1.47%
Proceedings of SPIE - The International Society for Optical Engineering
10 citations, 1.47%
Nanobiotechnology Reports
9 citations, 1.32%
Optics Communications
8 citations, 1.17%
Physical Review Letters
7 citations, 1.03%
Applied Optics
7 citations, 1.03%
Technical Physics Letters
7 citations, 1.03%
Scientific Reports
6 citations, 0.88%
Comptes Rendus Physique
6 citations, 0.88%
Inorganic Chemistry Communication
6 citations, 0.88%
Кристаллография
6 citations, 0.88%
Optics Letters
5 citations, 0.73%
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
5 citations, 0.73%
Spectrochimica Acta, Part B: Atomic Spectroscopy
5 citations, 0.73%
Physica Status Solidi (B): Basic Research
5 citations, 0.73%
Journal of Instrumentation
5 citations, 0.73%
Journal of Materials Research
4 citations, 0.59%
Computer Optics
4 citations, 0.59%
Microscopy and Microanalysis
4 citations, 0.59%
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
4 citations, 0.59%
Journal of Contemporary Physics
4 citations, 0.59%
Acta Crystallographica Section A: Foundations and Advances
4 citations, 0.59%
Microelectronic Engineering
4 citations, 0.59%
Sensors
4 citations, 0.59%
Bulletin of the Russian Academy of Sciences: Physics
4 citations, 0.59%
Поверхность Рентгеновские синхротронные и нейтронные исследования
4 citations, 0.59%
AIP Advances
3 citations, 0.44%
Journal of Applied Crystallography
3 citations, 0.44%
Microsystem Technologies
3 citations, 0.44%
Physical Review A
3 citations, 0.44%
Crystal Growth and Design
3 citations, 0.44%
Current Opinion in Solid State and Materials Science
3 citations, 0.44%
Materials
3 citations, 0.44%
Physical Review B
3 citations, 0.44%
Physics Procedia
3 citations, 0.44%
Procedia Structural Integrity
3 citations, 0.44%
IUCrJ
2 citations, 0.29%
Physica Status Solidi (A) Applications and Materials Science
2 citations, 0.29%
International Materials Reviews
2 citations, 0.29%
Particle and Particle Systems Characterization
2 citations, 0.29%
Journal Physics D: Applied Physics
2 citations, 0.29%
ChemPhysChem
2 citations, 0.29%
Applied Sciences (Switzerland)
2 citations, 0.29%
Springer Series in Surface Sciences
2 citations, 0.29%
Powder Diffraction
2 citations, 0.29%
Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics
2 citations, 0.29%
MRS Bulletin
2 citations, 0.29%
Advanced Materials
2 citations, 0.29%
IEEE Access
2 citations, 0.29%
Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena
2 citations, 0.29%
Journal of Environmental Monitoring
2 citations, 0.29%
Physik in unserer Zeit
2 citations, 0.29%
Springer Theses
2 citations, 0.29%
Advanced Micro and Nanosystems
2 citations, 0.29%
Solid State Phenomena
1 citation, 0.15%
New Journal of Physics
1 citation, 0.15%
Physics in Medicine and Biology
1 citation, 0.15%
Engineering Failure Analysis
1 citation, 0.15%
Advanced Optical Materials
1 citation, 0.15%
Physics Letters, Section A: General, Atomic and Solid State Physics
1 citation, 0.15%
Microelectronics Journal
1 citation, 0.15%
Journal of Communications Technology and Electronics
1 citation, 0.15%
Journal of Micro/ Nanolithography, MEMS, and MOEMS
1 citation, 0.15%
Physics Reports
1 citation, 0.15%
Journal of the Electrochemical Society
1 citation, 0.15%
CrystEngComm
1 citation, 0.15%
Metallofizika i Noveishie Tekhnologii
1 citation, 0.15%
International Journal of Architectural Heritage
1 citation, 0.15%
Optical Materials Express
1 citation, 0.15%
Frontiers in Physics
1 citation, 0.15%
Communications in Computer and Information Science
1 citation, 0.15%
Computation
1 citation, 0.15%
GAMM Mitteilungen
1 citation, 0.15%
Journal of Applied Physics
1 citation, 0.15%
Applied Physics A: Materials Science and Processing
1 citation, 0.15%
Journal of Experimental and Theoretical Physics
1 citation, 0.15%
Acta Physica Polonica A
1 citation, 0.15%
Springer Handbooks
1 citation, 0.15%
Crystals
1 citation, 0.15%
International Journal of Quantum Chemistry
1 citation, 0.15%
Nanotechnology
1 citation, 0.15%
Measurement Science and Technology
1 citation, 0.15%
Journal of Imaging
1 citation, 0.15%
Houille Blanche
1 citation, 0.15%
Optica
1 citation, 0.15%
Analytical Chemistry
1 citation, 0.15%
Acta Physica Sinica
1 citation, 0.15%
European Physical Journal Plus
1 citation, 0.15%
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140

Publishers

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20
SPIE-Intl Soc Optical Eng
19 publications, 33.93%
Elsevier
12 publications, 21.43%
Pleiades Publishing
6 publications, 10.71%
AIP Publishing
6 publications, 10.71%
Wiley
3 publications, 5.36%
Springer Nature
1 publication, 1.79%
EDP Sciences
1 publication, 1.79%
Trans Tech Publications
1 publication, 1.79%
MDPI
1 publication, 1.79%
Image Processing Systems Institute of RAS
1 publication, 1.79%
International Union of Crystallography (IUCr)
1 publication, 1.79%
American Physical Society (APS)
1 publication, 1.79%
IOP Publishing
1 publication, 1.79%
Chinese Society of Rare Earths
1 publication, 1.79%
Institute of Electrical and Electronics Engineers (IEEE)
1 publication, 1.79%
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16
18
20

Organizations from articles

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35
40
Institute of Microelectronics Technology and High Purity Materials of the Russian Academy of Sciences
38 publications, 29.46%